Renishaw Raman-SPM/AFM Combined Systems

The Renishaw Raman-SPM/AFM systems integrate the inVia™ Raman microscope with atomic force and scanning probe microscopy, allowing nanoscale analysis of materials. This combined setup provides simultaneous Raman and AFM data collection from the same sample location, ensuring data accuracy. The system supports a range of AFMs from top manufacturers, making it adaptable to various research needs. Tip-enhanced Raman scattering (TERS) is available for nanometre-scale chemical analysis, while the optical coupling arm ensures high efficiency and fast spectral acquisition.

Nanoscale Chemical, Structural, and Property Analysis:
This integrated system allows for simultaneous Raman and AFM measurements, providing detailed chemical, structural, and mechanical information at the nanoscale. This enables precise material characterisation, including mapping molecular compositions and surface properties.

Supports Multiple AFM/SPM Brands for Flexible Configurations:
The system is compatible with various leading AFM and SPM manufacturers, allowing users to choose the best configuration for their research needs. This flexibility ensures easy integration into existing laboratory setups.

High-Efficiency Optical Integration with Easy Alignment:
The system’s optical design maximises signal throughput and minimises loss, ensuring high-quality Raman data collection. It features straightforward alignment procedures, making switching between different configurations and techniques easy.

TERS Capability for Detailed Chemical Mapping:
With tip-enhanced Raman scattering (TERS), the system can achieve nanometre-scale chemical analysis, providing high-resolution maps of molecular distributions. TERS enhances sensitivity, allowing for the detection of low-concentration species and subtle chemical changes.